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Ehrenfried Zschech is working in Fraunhofer Institute for Non-Destructive Testing (IZFP). He was Sr. Manager of the Center for Complex Analysis at GlobalFoundries in Dresden. He joined Advanced Micro Devices in 1997. His responsibilities include the analytical support for process control and technology development, as well as physical failure analysis. He received his diploma degree in solid-state physics and his Dr. rer. nat. degree from Dresden University of Technology. After having spent four years as a project leader in the field of metal physics and reliability of microelectronics interconnects at Research Institute of Non-Ferrous Metals in Freiberg, he was appointed as a university teacher for ceramic materials at Freiberg University of Technology. In 1992, he joined the development department at Airbus in Bremen. There he managed the metal physics group and worked on laser joining metallurgy of light metals. His current research interests are in the areas of thin film materials compatibility, structure and materials analysis and physical failure analysis in integrated circuit applications. He has published three books and more than 100 papers in scientific journals in the areas of solid-state physics and materials science. He is honorary professor for nanomaterials at the Brandenburg University of Technology in Cottbus, Germany.