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-Atomic imaging
-Characterisation
-Drug and Gene Delivery
-Nano-bio Materials
-Nanoparticles manufacturing
-Nanophotonics for ICT
-Nanosensor Systems
-Nanosensors and Diagnostics
-Nanostructured Materials
-Nanoparticles applications
-Nanowires
-New FETs
-Photonics 2
-Waveguides
-Polymers
-Wires and Tubes

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Instruments 1: Atomic imaging

	Chair: Risto Nieminen, Helsinki University of Technology, Finland
	Invited academic: Transmission Electron Microscopy without Aberrations Crispin Hetherington University of Oxford
	Ultra-high resolution nano-characterisation and analysis using advanced S/TEM Dominique Hubert FEI Company
	Time-of-Flight SIMS Applications: From Semiconductor to Biology Sven Kayser ION-TOF
	DHM technology for 3D non-contact dynamical measurements Frédéric Montfort ST Instruments
	ionLiNE a New Tool Concept for Nanofabrication in Surface Science and Thin Film Engineering Andreas Rampe Raith

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